Probe for high speed scanning

Details Probe for high speed scanning Probe for high speed scanning

2006-10-24

2006-10-24

Fulton, Christopher W. (Department: 2859)

Geometrical instruments

Gauge

Having a movable contact probe

C033S559000

Reexamination Certificate

active

07124514

ABSTRACT:
A measurement probe (5) which comprises a housing (16) for mounting on an arm (6) of a coordinate positioning apparatus (2) and a stylus (10) mounted on a stylus support member (28). The stylus (10) and the stylus support member (28) are deflectable with respect to the housing (16). A first transducer system (40–48) measures movement of the stylus support member (28) relative to the arm (6) of the coordinate positioning apparatus (2). A second transducer system (38) measures movement of the stylus tip (12) relative to the stylus supporting member (28). A measurement of total stylus deflection is achieved by combining data from the first and second transducer systems.

REFERENCES:
patent: 3869799 (1975-03-01), Neuer et al.
patent: 4397188 (1983-08-01), Bansevichus et al.
patent: 4530159 (1985-07-01), Ernst
patent: 5040306 (1991-08-01), McMurtry et al.
patent: 5048194 (1991-09-01), McMurtry
patent: 5339535 (1994-08-01), McMurtry et al.
patent: 5390424 (1995-02-01), Butter et al.
patent: 0 869 328 (1998-10-01), None
patent: WO 90/07097 (1990-06-01), None
patent: WO 00/60310 (2000-10-01), None

Affiliated with

Also associated with

Rating

Probe for high speed scanning does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe for high speed scanning, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe for high speed scanning will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3694732