Probe for electrical measurement methods, especially eddy...

Details Probe for electrical measurement methods, especially eddy... Probe for electrical measurement methods, especially eddy...

2004-06-23

2008-12-09

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

C324S696000, C324S220000

Reexamination Certificate

active

07463039

ABSTRACT:
When using a rigid substrate eddy current probe to measure a non-planer test piece, the probe must be adapted to the test piece shape in order to avoid incorrect measurement values. Disclosed is a probe which is configured in a flexible manner via a flexible substrate so as to be adjustable to different radii of curvature of a test piece. Furthermore the probe lining is also embodied in an elastic manner.

REFERENCES:
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patent: 5315234 (1994-05-01), Sutton, Jr. et al.
patent: 5389876 (1995-02-01), Hedengren et al.
patent: 6002251 (1999-12-01), Sun
patent: 197 48 556 (1999-05-01), None
patent: 10197492 (1998-07-01), None
patent: WO 03/060530 (2003-07-01), None

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