Probe for composite analyzer tester

Measuring and testing – Vibration – Sensing apparatus

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

73643, G01N 2904

Patent

active

047473100

ABSTRACT:
A composite analyzer probe, for use with a composite analyzer tester instrument for nondestructively testing and analyzing the physical properties and gaging the thickness of a test material. A cylindrical probe housing has a generally flat end surface designed to be placed flat against the surface of the test material. An annular magnetic induction coil is positioned against the end surface, a piezoelectric element having a hollow cylindrical casing is positioned within the annular magnetic induction coil, and an eddy current coil is positioned within the piezoelectric cylindrical casing. The single improved probe allows four different measurements to be taken at one location on the test material without any required movement or replacement of the probe.

REFERENCES:
patent: 3403547 (1968-10-01), Schwartz
patent: 4307611 (1981-12-01), Opara
patent: 4523473 (1985-06-01), Chamuel

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Probe for composite analyzer tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe for composite analyzer tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe for composite analyzer tester will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1868022

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.