Probe for combined signals

Details Probe for combined signals Probe for combined signals

2006-05-16

2006-05-16

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S500000

Reexamination Certificate

active

07046023

ABSTRACT:
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor and transmitting of a direct current to the device-under-test over a second signal path that avoids the impedance matching resistor.

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“Laser Diode Test Solution,” unknown, www.cascademicrotech.com/index.cfm/fuseaction/pg.view/pID/136, Cascade Microtech Inc., Beaverton, Oregon.

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