Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1983-10-18
1985-11-19
Haroian, Harry N.
Geometrical instruments
Gauge
Movable contact probe, per se
33169R, 33172E, G01B 702
Patent
active
045533326
ABSTRACT:
A probe for checking linear dimensions of mechanical parts comprises a support, a movable arm carrying a feeler adapted for contacting the part to be checked and an integral member coupled to the movable arm and the support. The member includes a first portion fixed to the movable arm a second portion fixed to the support and an intermediate portion having two sections with reduced thickness which define two axes of mutual rotation of the first and second portion. An electrical circuit closed under rest conditions comprises two pairs of electrical contacts which are opened in consequence of displacements of the movable arm along opposite directions or of an axial displacement of the arm.
REFERENCES:
patent: 3149421 (1964-09-01), O'Brien
patent: 3945124 (1976-03-01), Jacoby
patent: 4078314 (1978-03-01), McMurtry
patent: 4130941 (1978-12-01), Amsbury
patent: 4341019 (1982-07-01), Possati
patent: 4441257 (1984-04-01), Golinelli
patent: 4447958 (1984-05-01), Tanaka
Dall'aglio Carlo
Golinelli Guido
Finike Italiana Marposs S.p.A.
Haroian Harry N.
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