Probe for an apparatus for analyzing metals by X-ray fluorescenc

Details Probe for an apparatus for analyzing metals by X-ray fluorescenc Probe for an apparatus for analyzing metals by X-ray fluorescenc

1980-12-15

1987-08-11

Anderson, Bruce I.

X-ray or gamma ray systems or devices

Source

Nuclear excited

378 45, 2504981, G21K 502, G01N 23223

Patent

active

046866949

ABSTRACT:
An apparatus for analyzing metal alloys includes an electronic unit connected to a hand-held probe unit. The probe unit includes a radiation detector enclosed in a detector housing and a radiation source enclosed in a source housing. The detector housing is generally cylindrical in shape and has an aperture formed in its sidewall. The source housing is formed as a hollow, generally right triangular prism with an open base attached to the detector housing over the aperture and tapering to a tip having an aperture formed therein. The triangular shape of the source housing permits contact measurements in hard to get at places. A shutter drive mechanism is utilized to move a shutter means between a first position blocking radiation and a second position passing radiation from the source to the aperture in the tip of the source housing. Radiation from the source generates X-rays from a sample of material to be analyzed which X-rays pass through the aperture in the tip of the source housing and the aperture in the side wall of the detector housing to the radiation detector.

REFERENCES:
patent: 3141976 (1964-07-01), MacIntyre
patent: 3177364 (1965-04-01), Green
patent: 3889113 (1975-06-01), Rhodes
patent: 4167674 (1979-09-01), Koontz et al.
patent: 4178513 (1979-12-01), Dubois et al.

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