Probe for a coordinate measuring machine

Details Probe for a coordinate measuring machine Probe for a coordinate measuring machine

1975-07-22

1976-11-16

Aegerter, Richard E.

Geometrical instruments

Area integrators

Electrical

33174L, 33125C, 356169, 250224, G01B 731

Patent

active

039914771

ABSTRACT:
A probe assembly is disclosed carrying a grid grating and an index grating adapted to generate a Moire pattern upon relative movement in either or both of two orthogonal directions in a common plane. The index and grid gratings are supported for precise orthogonal motion with respect to each other by means of a pair of grating support assemblies mounted so that the correct index and grid grating spacing and orientation are precisely maintained, including a cross-slide assembly provided to allow movement in a plane while maintaining the proper orientation between the grating assemblies.

REFERENCES:
patent: 2886717 (1959-05-01), Williamson et al.
patent: 3184600 (1965-05-01), Potter
patent: 3916528 (1975-11-01), Eisenkopf

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