Probe device, probe card channel information creation...

Details Probe device, probe card channel information creation... Probe device, probe card channel information creation...

2005-11-08

2005-11-08

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06963208

ABSTRACT:
A probe device includes a supporting member for supporting the probe card having a plurality of channels. Each of the channels has a group of probes which are brought into contact with plural electrode pads of one of objects to be inspected. The probe device further includes a channel information creation unit for creating channel information containing a layout of a group of the plurality of channels and an identification number of each of the channels and transmitting the created channel information to a controller, a channel information memory unit for storing the channel information received from the channel information creation unit, and an object layout memory unit for storing layout information of the objects. The controller performs an inspection of the objects based on the channel information stored in the channel information memory unit and the layout information of the objects stored in the object layout memory unit.

REFERENCES:
patent: 5206582 (1993-04-01), Ekstedt et al.
patent: 5585737 (1996-12-01), Shibata
patent: 6362013 (2002-03-01), Yoshimura
patent: 7-321167 (1995-12-01), None

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