Probe device for electrical testing an integrated circuit...

Details Probe device for electrical testing an integrated circuit... Probe device for electrical testing an integrated circuit...

2006-05-30

2006-05-30

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S758010, C324S1540PB

Reexamination Certificate

active

07053636

ABSTRACT:
The present probe device comprises an insulative body, at least one supporter positioned in the insulative body, a probe positioned substantially at the center of the supporter, and a conductive wire positioned in the insulative body and electrically connected to the supporter. The supporter can be a helical spring, which connects to the probe with its inner end and to the insulative body with its outer end. In addition, the supporter may include a plurality of beams, which connects to the probe at one end and to the insulative body at the other end. The beams are positioned in a radial manner with the probe at the center, and the included angle between two adjacent beams is substantially the same. The supporter can further comprise at least one ring connecting the plurality of beams.

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patent: 2004/0124861 (2004-07-01), Zaerpoor

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