Probe device and method of controlling the same

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 731, 371 221, G01R 3102, G01R 3128

Patent

active

050346849

ABSTRACT:
A probe device having a loader unit and two measuring units is disclosed. Each of the loader and measuring units is an independent unit supported by an independent casing. Each of the loader and measuring units has its exclusive slave CPU and integrated circuit members are under the control of this slave CPU to manage operations of members at the unit. The slave CPUs are connected to a master CPU, which controls the slave CPUs and which is also an independent unit, and they are connected to one another only through the master CPU. Program language is common to the master and slave CPUs and the units can be electrically connected to form an integral control system in which signals are exchanged among the units.

REFERENCES:
patent: 4698775 (1987-10-01), Koch et al.
patent: 4856904 (1989-08-01), Akagawa

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Probe device and method of controlling the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe device and method of controlling the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe device and method of controlling the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-434570

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.