Probe contacting electrode and electronic device

Details Probe contacting electrode and electronic device Probe contacting electrode and electronic device

2007-06-11

2009-10-06

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07598763

ABSTRACT:
A probe contacting electrode that is formed on a surface of a package of an electronic device and to which a probe of a probe device is contacted, including a lower layer part and an upper layer part made of a softer conductive material than a conductive material that forms the lower layer part.

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