Probe contact and junction detector

Details Probe contact and junction detector Probe contact and junction detector

1976-03-16

1977-07-26

Rolinec, Rudolph V.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324 73R, 324133, G01R 3102, G01R 1916

Patent

active

040385981

ABSTRACT:
The detection and indication of a probe contact to metalization and to junctions on chips during microcircuit analysis is achieved by means of a circuit comprising a complementary MOS transistor logic circuit and light emitting diodes (LEDs). A polarity switching circuit provides probe contact indication in response to "0" and "1" logic levels for both forward and reverse bias conditions. Other switching circuits provide sensitivity level selection and the transfer of probe output to an alternate microcircuit analysis device. An auxiliary sound indicator is connected in parallel with the visual LED indicators. Probe assembly capacitance is minimized by a plexiglass insulator that inserts a fixed capacitance between each probe contact.

REFERENCES:
patent: 3787735 (1974-01-01), DeWitte et al.
patent: 3838339 (1974-09-01), Brandt

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