Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1998-01-30
2000-07-25
Karlsen, Ernest
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324754, G01R 102
Patent
active
060940425
ABSTRACT:
A probe tip for connecting an instrument to a circuit under test is disclosed. The probe tip is interchangeable with other probe tips to provide different attenuations of the signal under test to the instrument. The signal from the circuit under test is coupled to the instrument via a cable. The probe tips have a compensation network that cancels the effects of cable loss. The probe tips provide attenuation by using the probe tips internal impedance, and the characteristic impedance of the cable, to form a voltage divider.
REFERENCES:
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"Nanosecond Passive Voltage Probes" by Patrick A. McGovern, published in IEEE Transactions On Instrumentation And Measurement, vol. 1M-26, No. 1, Mar. 1977.
"Probes And Transducers", by John D. Lenk, 1994, chapter 5, published in McGraw Hill Electronic Testing Handbook: Procedures And Techniques, pp. 191-196, ISBN 0-07-037602-6(H).
"Probes And Input Circuits", by T.H. O'Dell, 1991, chapter 5, published in Circuits For Electronic Instrumentation, pp. 72-89, published by Cambridge University Press ISBN 0-521-40428-2.
HP Catalog--1983--10020A Rensistive Dividers.
Agilent Technologies
Karlsen Ernest
Solis Jose M.
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