Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-04
2009-06-09
Hollington, Jermele M (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07545160
ABSTRACT:
The present invention provides a probe chip and a probe card in which when troubles such as breakage etc. occur in a probe of a contact portion of a probe card, the contact portion can be easily replaced with another one. In the probe card having a guide frame, a probe chip and a fixing jig, a second arm portion of a cantilever of the probe chip is abutted on a conductive path of a fixing jig such that the probe chip is held or pressed down and fixed to the guide frame with the second arm portion being elastically deformed.
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Takoshima Takehisa
Watanabe Tsuyoshi
Enplas Corporation
Hollington Jermele M
Staas & Halsey , LLP
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