Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2006-02-28
2006-02-28
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S715000, C324S754090, C324S757020
Reexamination Certificate
active
07005842
ABSTRACT:
A probe cartridge assembly and a multi-probe assembly (10) including a mounting plate having a plurality of the probe cartridge assemblies mounted on the mounting plate. The probe cartridge assembly generally includes a mounting member, a probe insulator (30), a probe (40), a ferrule (50), a lead insulator (60), a retaining member (70), and a wire having an electrical lead. The electrical lead is positioned within a cavity in the ferrule, and an inclined surface of the ferrule is contacted to an inclined surface of the probe within an area defined by the probe insulator and the lead insulator. The probe insulator and the lead insulator are held within an area defined by the mounting member and the retaining member. The retaining member and the mounting member are adjustably mated to each other in order to provide a clamping force to ensure proper electrical interconnection between the electric lead, the ferrule, and the probe.
REFERENCES:
patent: 4491788 (1985-01-01), Zandonatti
patent: 5339039 (1994-08-01), Carlile et al.
patent: 5686832 (1997-11-01), Ayres et al.
patent: 5723979 (1998-03-01), Mohr
patent: 5942701 (1999-08-01), Kamiya
patent: 5982187 (1999-11-01), Tarzwell
Fink Steven T.
Windhorn Thomas H.
Deb Anjan
Teresinski John
Tokyo Electron Limited
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