Probe card with stacked substrate

Details Probe card with stacked substrate Probe card with stacked substrate

2011-03-01

2011-03-01

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755070

Reexamination Certificate

active

07898276

ABSTRACT:
A probe card is provided including a first substrate, a second substrate, and a plurality of conductive wires extending between the first substrate and the second substrate. The conductive wires are fixed (a) at a first end to a contact of the first substrate, and (b) at a second end to a contact of the second substrate.

REFERENCES:
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patent: 6420884 (2002-07-01), Khoury et al.
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patent: 6552555 (2003-04-01), Nuytkens et al.
patent: 7459795 (2008-12-01), Eldridge et al.
patent: 2003/0127246 (2003-07-01), Watanabe et al.
patent: 2004/0008044 (2004-01-01), Hohenwarter
patent: 2004/0124519 (2004-07-01), Zhou et al.
patent: 2004/0127074 (2004-07-01), Eldridge

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