Probe card with segmented substrate

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Reexamination Certificate

active

08058889

ABSTRACT:
A probe card for testing of semiconductor dice is provided. The probe card includes a mounting plate and a plurality of substrate segments supported by the mounting plate.

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Claims, international application No. PTC/US2005/043294, 3 pages.
International Searching Authority, “Written Opinion of the International Searching Authority”, international application No. PTC/US2005/043294, dated Jun. 14, 2007, 8 pages.
European Patent Office, “Communication pursuant to Article 96(2) EPC”, International application No. PTC/US2005/043294, Nov. 5, 2007, 8 pages.

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