Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-30
2011-11-15
Hollington, Jermele M (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
08058889
ABSTRACT:
A probe card for testing of semiconductor dice is provided. The probe card includes a mounting plate and a plurality of substrate segments supported by the mounting plate.
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Becker Edward A.
Hickman Palermo & Truong & Becker LLP
Hollington Jermele M
SV Probe Pte. Ltd.
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