Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-02-01
1999-09-07
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, G01R 3102
Patent
active
059492457
ABSTRACT:
A probe card for use in a multi-chip probing test equipment with reduced noise coupling effect is disclosed. It contains (a) a multi-layer circuit board with a window formed at a central portion thereof, the multi-layer circuit board containing a number of contact points arranged on the surface ofthe multi-layer circuit board for electrically contacting the test head of the test equipment; (b) a plurality of downward pointing testing pins attached to the multi-layer circuit board and electrically connected to the contact points on the surface ofthe multi-layer circuit board, the testing pins being arranged to face a plurality of semiconductor chips so as to tests to be conducted on the plurality of semiconductor chips; (c) a ground layer formed in the multi-layer circuit board; and (d) a plurality of spaced apart ground paths arranged across the window of the multi-layer circuit board. The plurality of ground paths are connected to the ground layer of the multi-layer circuit board and are arranged so as to separate the testing pins into a plurality of groups each corresponding to a respect semiconductor chip to be tested. The ground layer and the ground paths collectively form a ground shield structure to isolate the semiconductor chips from each other to thereby reduce a ground noise coupling effect between adjacent semiconductor chips during the multi-chip testing.
REFERENCES:
patent: 4780670 (1988-10-01), Cherry
patent: 5382898 (1995-01-01), Subramanian
Liauh W. Wayne
Nguyen Vinh P.
Powership Semiconductor Corp.
LandOfFree
Probe card with ground shield structure to minimize noise coupli does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe card with ground shield structure to minimize noise coupli, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card with ground shield structure to minimize noise coupli will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1807630