Probe card with an adapter layer for testing integrated...

Details Probe card with an adapter layer for testing integrated... Probe card with an adapter layer for testing integrated...

2005-01-25

2005-01-25

Cuneo, Kamand (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06847218

ABSTRACT:
In one embodiment, an environment for testing integrated circuits includes a first die coupled to a tester. The first die includes a removable connection configured to couple a signal from the first die with an adapter layer to a second die being tested. The removable connection may be an elastomeric interposer or a probe, for example.

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PCT International Search Report for PCT/US03/14844 mailed Sep. 18, 2003, total of 2 sheets.

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