Probe card including a multiplicity of probe contacts and method

Details Probe card including a multiplicity of probe contacts and method Probe card including a multiplicity of probe contacts and method

1975-07-16

1976-04-27

Lanham, C. W.

Metal working

Method of mechanical manufacture

Electrical device making

29625, H01R 4300

Patent

active

039524108

ABSTRACT:
Presented is a probe card useful in testing the effectiveness and utility of semiconductor devices and hybrid circuit substrates prior to the application to such devices and substrates of terminal leads for interconnection with other components. The probe card includes a unitary electrically conductive probe assembly including a multiplicity of closely spaced conductive probes arranged in a radiating array to provide a multiplicity of contact tips adapted to be pressed with uniform pressure and contact resistance on the terminal pads of semiconductor devices and hybrid circuit substrates.

REFERENCES:
patent: 3377514 (1968-04-01), Ruehlemann et al.
patent: 3405361 (1968-10-01), Kattiner et al.
patent: 3437929 (1969-04-01), Glenn
patent: 3445770 (1969-05-01), Harmon
Brunner et al., Microcircuit Probe, IBM Technical Disclosure Bulletin, Vol. 9, No. 9, 2/1967.

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