Probe card in which contact pressure and relative position of ea

Details Probe card in which contact pressure and relative position of ea Probe card in which contact pressure and relative position of ea

1991-07-24

1992-07-28

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, G01R 106, G01R 3102

Patent

active

051343657

ABSTRACT:
Probe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable. The disclosure refers to additional devices to enhance the convenience in determining the alignment between the probe front ends and the IC ends, and also in obtaining accurate measurements of an IC chip under test.

REFERENCES:
patent: 3445770 (1969-04-01), Harmon
patent: 3835381 (1974-08-01), Garretson et al.
patent: 3866119 (1975-03-01), Ardezzone et al.
patent: 4906920 (1990-03-01), Huff et al.
patent: 4975638 (1990-12-01), Evans et al.

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