Probe card head protection device for wafer sort set up

Details Probe card head protection device for wafer sort set up Probe card head protection device for wafer sort set up

2006-09-12

2009-10-06

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07598727

ABSTRACT:
A protective mechanism for a probe card cover to prevent the probe card cover or attachment screws extending from the probe card cover from striking a wafer in a test system if the probe card is installed without removing the cover. The protective mechanism includes an elongate member that can be permanently attached to the probe card cover, or attached by screws to the probe card cover. The protective mechanism can be a bar that extends longer than an opening in a probe card holder tray through which probes of the probe card pass during testing. The bar can be hard, yet flexible enough to prevent damage to the probe card holder tray or probe card.

REFERENCES:
patent: 5026295 (1991-06-01), Fong et al.
patent: 5444386 (1995-08-01), Mizumura
patent: 5597317 (1997-01-01), Hansell et al.
patent: 5746611 (1998-05-01), Brown et al.
patent: 6354844 (2002-03-01), Coico et al.
patent: 6960923 (2005-11-01), Eldridge et al.

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