Probe card, having cantilever-type probe and method

Details Probe card, having cantilever-type probe and method Probe card, having cantilever-type probe and method

2007-08-14

2007-08-14

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

10284085

ABSTRACT:
A probe card is used to test an electronic device. The probe card includes a base plate and a cantilever-type probe arranged on the base plate. The cantilever-type probe has an end that contacts the contacted body and moves when contacting the contacted body. A stopper arranged on the base plate restricts the movement of the cantilever-type probe.

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Office Action dated Jul. 25, 2006 in prosecution of corresponding Japanese patent application.
Japanese Office Action dated Jun. 5, 2007 for related Japanese patent application.

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