Probe card for testing integrated circuit chips

Details Probe card for testing integrated circuit chips Probe card for testing integrated circuit chips

1992-06-10

1994-07-12

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324761, 361754, 439160, G01R 3102, G01R 1073, H05K 716

Patent

active

053292260

ABSTRACT:
A ring maintains a circular daughtercard (32) plugged into a mothercard (30) and includes structure for removing the daughtercard from the mothercard. The ring includes: an inner vertical threading to be screwed on an external threading fixed to the mothercard (30), and a bottom portion having a cylindric recess for accommodating the daughtercard (32), the recess being coaxial to the threadings and having a depth substantially equal to the thickness of the daughtercard (32). The ring also includes at its bottom portion a plurality of vertical traversing rods (42) distributed about the recess, each having, at one end, an eccentric portion for releasing the daughtercard (44), and, at the other end, a roller for manipulating the rod and the eccentric portion. Each rod is manually operable by the roller to be brought to a first position, where its eccentric portion partially covers the recess while maintaining the daughtercard (32) without pressure in the recess, or to a second position where its eccentric portion does not maintain the daughtercard in the recess.

REFERENCES:
patent: 2984811 (1961-05-01), Hennessey, Jr. et al.
patent: 3363179 (1968-01-01), McCutcheon
patent: 4862077 (1989-08-01), Horel et al.
patent: 4899106 (1990-02-01), Ogura
patent: 4923404 (1990-05-01), Redmond et al.
patent: 5055780 (1991-10-01), Takagi et al.

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