Probe card covering system and method

Details Probe card covering system and method Probe card covering system and method

2006-10-31

2006-10-31

Duverne, J. F. (Department: 2839)

Electrical connectors

With contact preventer or retractable cover part

Movably mounted

Reexamination Certificate

active

07128587

ABSTRACT:
The present invention discloses a cover over electrical contacts of a probe card used in testing die on a wafer. A testing machine is disclosed as having the covered probe card therein. Various mechanisms for uncovering the electrical contacts while it is located in the tester machine are disclosed.

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