Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2010-09-09
2011-10-18
Velez, Roberto (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S756030
Reexamination Certificate
active
08040147
ABSTRACT:
A holding section (2) holds a probe card (1). Transport mechanisms (3ato3d) have the function of transporting the probe card (1) from the holding section (2). A lock mechanism (4) is provided for the transport mechanism (3d). When the probe card cassette is placed in prober equipment, the lock mechanism (4) is released to allow the probe card (1) to be transported from the holding section (2) by the transport mechanisms (3ato3d). When the probe card cassette is not placed in the prober equipment, the lock mechanism (4) operates to fix the probe card (1) in the holding section (2).
REFERENCES:
patent: 6838892 (2005-01-01), Suzuki
patent: 7288954 (2007-10-01), Kirby et al.
patent: 02-052447 (1990-02-01), None
patent: 03-028772 (1991-02-01), None
patent: 06-174749 (1994-06-01), None
patent: 2005-150224 (2005-06-01), None
Nozaki Shiro
Ohtori Takashi
Tsunogaki Kenichi
McDermott Will & Emery LLP
Panasonic Corporation
Velez Roberto
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