Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-01-04
2005-01-04
Thai, Luan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06838892
ABSTRACT:
A probe card conveyor10comprises a probe card conveyor10, a body12provided with the probe card conveyor10, and coupling mechanisms13provided in a plurality of positions on that side of the body12which is opposed to the probe device20and coupled individually to four coupled fittings22of the probe device20. Further, the probe card conveyor10comprises a probe card mounting mechanism17for transferring a probe card21in the Y-direction and a lift mechanism18for raising and lowering the probe card mounting mechanism17.
REFERENCES:
patent: 4864227 (1989-09-01), Sato
patent: 5148103 (1992-09-01), Pasiecznik, Jr.
patent: 5254939 (1993-10-01), Anderson et al.
patent: 5444386 (1995-08-01), Mizumura
patent: 6072325 (2000-06-01), Sano
patent: 6107813 (2000-08-01), Sinsheimer et al.
patent: 6414478 (2002-07-01), Suzuki
patent: 6762616 (2004-07-01), Kawaguchi et al.
patent: 62-169341 (1987-07-01), None
patent: 02-001141 (1990-01-01), None
patent: 5-136219 (1993-06-01), None
patent: 05-136222 (1993-06-01), None
patent: 05136223 (1993-06-01), None
patent: 5-175290 (1993-07-01), None
Hollington Jarmele
Tokyo Electron Limited
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