Probe card capable of multi-probing

Details Probe card capable of multi-probing Probe card capable of multi-probing

2006-12-27

2010-02-09

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

07659735

ABSTRACT:
A probe card capable of multi-probing includes a print circuit board having a plurality of contact portions and a test module having a plurality of test boards. Each of the test boards includes at least one probing portion on which a plurality of needles are arrayed. The test module selects one of the test boards and probes semiconductor chips formed on a semiconductor wafer through the needles arrayed on the probing portion of the selected test board.

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patent: 1998-021866 (1998-07-01), None
patent: 2000-0008954 (2000-05-01), None

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