Probe card assembly with an interchangeable probe insert

Details Probe card assembly with an interchangeable probe insert Probe card assembly with an interchangeable probe insert

2011-03-01

2011-03-01

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07898242

ABSTRACT:
A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The insert holder can be detached from the probe card assembly. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.

REFERENCES:
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6600334 (2003-07-01), Hembree et al.
patent: 6815961 (2004-11-01), Mok et al.
patent: 6965244 (2005-11-01), Miller
patent: 7102367 (2006-09-01), Yamagishi et al.
patent: 7498825 (2009-03-01), Eldridge et al.
patent: 2001/0054906 (2001-12-01), Fujimura
patent: 2007/0139061 (2007-06-01), Eldridge

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