Probe card assembly with a dielectric strip structure...

Details Probe card assembly with a dielectric strip structure... Probe card assembly with a dielectric strip structure...

2007-08-10

2009-02-24

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07495459

ABSTRACT:
A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system is provided. The probe card assembly includes a plurality of probes supported by a support substrate, each of the plurality of probes including an end portion extending away from the support substrate. The end portion is configured to be electrically connected to a semiconductor device to be tested. The probe card assembly also includes a dielectric sheet positioned between the support substrate and the end portion of the plurality of probes such that the probes extend through apertures defined by the dielectric sheet.

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patent: 2000241453 (2000-09-01), None
European Patent Office, “Communication pursuant to Article 94(3) EPC”, Application No. 06752199.2216, dated Aug. 5, 2008, 3 pages.

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