Probe card assembly having a ceramic probe card

Details Probe card assembly having a ceramic probe card Probe card assembly having a ceramic probe card

1994-04-15

1996-08-13

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3102, G01R 3128

Patent

active

055460127

ABSTRACT:
Disclosed is a probe card assembly which includes an interface card having a plurality of contact pads on at least one surface thereof, a probe card having a plurality of contact pads on at least one surface thereof, and a carousel interposed between the interface card and the probe card having a plurality of connecting means for making contact between the interface card contact pads and probe card contact pads. Also disclosed are the probe card.

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Morton et al; "High Performance AC chip Contactor"; IBM Technical Disclosure Bulletin; vol. 18, No. 3; Aug. 1975.

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