Probe card assembly for electronic device testing with DC...

Details Probe card assembly for electronic device testing with DC... Probe card assembly for electronic device testing with DC...

2011-04-12

2011-04-12

Nguyen, Vinh P (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754030

Reexamination Certificate

active

07924035

ABSTRACT:
A test system can include contact elements for making electrical connections with test points of a DUT. The test system can also include a DC test resource and a signal router, which can be configured to switch a DC channel from the DC test resource between individual contact elements in a group of contact elements.

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PCT/US2009/049719: Int'l Search Report and Written Opinion (Jan. 4, 2010), 11 pages.

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