Probe card assembly and method of attaching probes to the...

Details Probe card assembly and method of attaching probes to the... Probe card assembly and method of attaching probes to the...

2007-09-18

2007-09-18

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S762010

Reexamination Certificate

active

11059246

ABSTRACT:
A probe card assembly is provided. The probe card assembly includes a substrate layer defining a plurality of apertures and a plurality of probes. Each of the probes has a base and a tip. The base of each probe is configured to be at least partially inserted within one of the plurality of apertures.

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International Searching Authority, “Notification of Transmittal of the International Search Report and the Written Opinion of the International Searching Authority or the Declaration,” PCT/US2006/005139, dated Jun. 26, 2006, 11 pages.
Current Claims, PCT/US2006/005139, 3 pages (attached).

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