Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-29
2008-04-29
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
11317408
ABSTRACT:
A probe card assembly has a probe contractor substrate having a plurality of probe contractor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts contacting the probe contractor substrate are vertically adjustable until secured by a locking mechanism which is coupled to the probe card wiring board. When the posts are secured in a fixed position, the position is one in which the plane of the plurality of probe contractor substrates is substantially parallel to a predetermined reference plane.
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Jun-Bo Yoon et al.; “Monolithic Integration of 3-D Electroplated Microstructures With Unlimited Number of Levels using Planarization With A Scarificial Metallic Mold (PSMM)”, Twelfth IEEE International Conference on Micro Electro Mechanical Systems; 1999 MEMS; Jan. 17-21, 1999; pp. 624-629.
Garabedian Raffi
Karklin Heather
Tea Nim Hak
Wang Steven
Karlsen Ernest
Pillsbury Winthrop Shaw & Pittman LLP
Touchdown Technologies, Inc.
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