Probe card apparatus

Details Probe card apparatus Probe card apparatus

1996-05-24

2000-03-14

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324762, G01R 1073

Patent

active

060377852

ABSTRACT:
Probe card apparatus includes a base element having a central cutout portion and an insert block is disposed in the cut out portion. A probe card secured to the base element includes a plurality of needle elements which contact electrical elements on an integrated circuit chip on a wafer being tested. The base element and probe card are secured to a printed circuit board. The insert contacts the needle elements and biases them against the electrical elements being tested. The insert block is positionable relative to the base element and to the needle elements, and the base element is positionable relative to the printed circuit board.

REFERENCES:
patent: 4518914 (1985-05-01), Okubo et al.
patent: 4636722 (1987-01-01), Ardezzone
patent: 5521518 (1996-05-01), Higgins

Affiliated with

Also associated with

Rating

Probe card apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Probe card apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-172938