Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-05-17
2009-02-24
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07495458
ABSTRACT:
One aspect of the invention provides an apparatus that includes a probe card having probe needles associated therewith. A temperature stabilizer element is couplable to the probe card. The temperature stabilizer is configured to either raise or lower a temperature of the probe needles to reduce movement of the probe needles.
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Harris Michael P.
McClanahan Adolphus E.
Mesa Frank J.
Wolfe John D.
Brady III Wade J.
Nguyen Ha Tran T
Nguyen Tung X
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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