Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-23
2009-08-25
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762010
Reexamination Certificate
active
07579850
ABSTRACT:
A probe card and a method for assembling the same, the probe card has a base plate, a plurality of probes, a fixing ring, and a fixing member. The fixing ring is provided with a hole and the outer wall of its bottom is used for connecting the probes. The fixing ring is spaced from the probes in a distance so that when the fixing ring is inserted through a hole of the base plate, the terminal ends of main bodies of the probes are located under the hole while the anterior ends are electronically connected with the base plate or outer circuit. The fixing member is inserted through the hole of the fixing ring, the terminal end of which protrudes out of the hole so that a micro strip line is formed between the terminal end of the fixing member and the terminal ends of the probes.
REFERENCES:
patent: 5124639 (1992-06-01), Carlin et al.
patent: 5134365 (1992-07-01), Okubo et al.
patent: 5382898 (1995-01-01), Subramanian
patent: 5841291 (1998-11-01), Liu et al.
patent: 5923178 (1999-07-01), Higgins et al.
Allstron Inc.
Muncy Geissler Olds & Lowe, PLLC
Tang Minh N
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