Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-01-20
2010-02-16
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S757020, C324S761010
Reexamination Certificate
active
07663386
ABSTRACT:
It is an object of the present invention to realize sure electrical connection between a contactor and an object to be inspected without influenced by heat, a reduction in the pre-heating time, and an enhanced throughput.A probe card of the present invention includes a contactor, a printed wiring board, an interposer provided between the contactor and the printed wiring board to have the both in elastic and electrical contact with each other, a coupling member integrating these, and a reinforcing member reinforcing the printed wiring board integrated via the coupling member.
REFERENCES:
patent: 5974662 (1999-11-01), Eldridge et al.
patent: 6791347 (2004-09-01), Ishizaka et al.
patent: 7075319 (2006-07-01), Mori
patent: 2004/0257098 (2004-12-01), Satou et al.
patent: 2008/0048698 (2008-02-01), Amemiya et al.
patent: 2008/0150558 (2008-06-01), Amemiya et al.
patent: 1328644 (2001-12-01), None
patent: 1 391 738 (2004-02-01), None
patent: 405218149 (1993-08-01), None
patent: 2000-67953 (2000-03-01), None
patent: 2002-134570 (2002-05-01), None
patent: 2003-506686 (2003-02-01), None
patent: 2003-324132 (2003-11-01), None
patent: 2004-14845 (2004-01-01), None
patent: 2004-77153 (2004-03-01), None
patent: WO 00/33096 (2000-06-01), None
patent: WO 01/09623 (2001-02-01), None
English language translation of the International Preliminary Examination report for PCT/JP2005/000657 mailed on Oct. 26, 2006.
First Office Action dated Feb. 1, 2008, issued in corresponding Chinese Application No. 200580002852.3.
Chan Emily Y
Finnegan Henderson Farabow Garrett & Dunner LLP
Nguyen Ha Tran T
Tokyo Electron Limited
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