Probe card

Details Probe card Probe card

2007-05-17

2008-11-18

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020, C324S761010

Reexamination Certificate

active

07453275

ABSTRACT:
The board of a probe card of the present invention comprises a first substrate having a first inclined surface at the side surfaces and a second substrate having a second inclined surface. The first substrate and the second substrate are disposed such that the first inclined surface and the second inclined surface are opposed to each other. Between the first inclined surface and the second inclined surface, a stress absorber having electroconductivity is sandwiched.

REFERENCES:
patent: 5623213 (1997-04-01), Liu et al.
patent: 6566149 (2003-05-01), Kanamaru et al.
patent: 6870385 (2005-03-01), Inoue et al.
patent: 2003/0176066 (2003-09-01), Zhou et al.
patent: 2007/0182430 (2007-08-01), Ismail et al.
patent: 1 640 730 (2006-03-01), None
patent: 2001-141771 (2001-05-01), None
patent: 2006-098064 (2006-04-01), None

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