Probe card

Details Probe card Probe card

2008-03-06

2008-12-02

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010, C324S762010

Reexamination Certificate

active

07459925

ABSTRACT:
A PCB of a probe card includes a first region, a second region, a third region and a fourth region arranged clockwise. The circuit pattern of the first region corresponds to the circuit pattern of the third region. The circuit pattern of the second region corresponds to the circuit pattern of the fourth region, wherein the circuit pattern of the first region is different from the circuit pattern of the second region.

REFERENCES:
patent: 7154285 (2006-12-01), Cheng

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