Electricity: measuring and testing – Magnetic – Magnetic information storage element testing
Reexamination Certificate
2007-02-27
2007-02-27
Aurora, Reena (Department: 2862)
Electricity: measuring and testing
Magnetic
Magnetic information storage element testing
Reexamination Certificate
active
11374023
ABSTRACT:
A probe card includes a base that supports a probe pin and an electromagnet. When the probe pin contacts a magnetic-sensor terminal in on a chip on a wafer, magnetic force is applied to a magnetic-field sensing section in the chips.
REFERENCES:
patent: 11-237368 (1999-08-01), None
Aurora Reena
Fujitsu Limited
Staas & Halsey , LLP
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