Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-24
2007-04-24
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S765010, C257S739000
Reexamination Certificate
active
10709435
ABSTRACT:
It is an object of the present invention to provide an arch type probe capable of enduring a load caused by overdriving even if the probe is miniaturized, and a probe card using the same. An arch type probe200has a shape including a first quarter circle arc portion210which is supported at one end thereof by the base plate100and a second quarter circle arc portion220which is connected to the other end of the first quarter circle arc portion210,extending toward the base plate and a little shorter than the first quarter circle arc portion221.The top portion of the arch type probe200serves as a contact surface brought into contact with an electrode of a semiconductor water B.
REFERENCES:
patent: 5225037 (1993-07-01), Elder et al.
patent: 5476211 (1995-12-01), Khandros
patent: 5977783 (1999-11-01), Takayama et al.
patent: 6307392 (2001-10-01), Socjima et al.
patent: 6496023 (2002-12-01), Kanamaru et al.
patent: 6628127 (2003-09-01), Takemoto et al.
patent: 6633176 (2003-10-01), Takemoto et al.
patent: 6680536 (2004-01-01), Hattori et al.
patent: 6741086 (2004-05-01), Maekawa et al.
patent: 2003/0034782 (2003-02-01), Hirano et al.
patent: 2 383 474 (2003-06-01), None
patent: 07-209334 (1995-08-01), None
patent: 11-326381 (1999-11-01), None
patent: 2001-41978 (2001-02-01), None
Furusho Toranosuke
Kimura Teppei
Machida Kazumichi
Mine Atsushi
Sakata Teruhisa
Armstrong, Kratz, Quintos Hanson & Brooks, LLP.
Chan Emily Y
Nguyen Ha Tran
Nihon Denshizairyo Kabushiki Kaisha
LandOfFree
Probe card does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Probe card, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Probe card will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3790850