Probe card

Details Probe card Probe card

2005-12-27

2005-12-27

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S756010, C324S758010

Reexamination Certificate

active

06980013

ABSTRACT:
A probe card including rectilinear probes; a guide base plate having an insulating property, in which a plurality of guide holes are formed through which the probes are inserted in a freely movable manner and a length of a guide hole is shorter than a length of a probe; and a plurality of sheet members having an insulating property, disposed above the guide base plate facing the plate, and laminated one on another with a spacing therebetween so as not to be in contact with one another. The tail ends of some of the probes can be brought into contact with the electrode pads on a lowest sheet member, and the tail ends of the other probes penetrate through the lowest sheet member so as to be enabled to be in contact with electrode pads on other sheet members.

REFERENCES:
patent: 4788496 (1988-11-01), Maelzer et al.
patent: 4963822 (1990-10-01), Prokopp
patent: 5525911 (1996-06-01), Marumo et al.
patent: 5644249 (1997-07-01), Kister
patent: 2002/0024347 (2002-02-01), Felici et al.
patent: 2004/0124862 (2004-07-01), Sugawara
patent: 11-344509 (1999-12-01), None

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