Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-08-03
2009-02-17
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S072500
Reexamination Certificate
active
07492170
ABSTRACT:
Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.
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Crook David T.
Tesdahl Curtis A
Agilent Technologie,s Inc.
He Amy
Nguyen Vincent Q
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