Probe based information storage for probes used for opens...

Details Probe based information storage for probes used for opens... Probe based information storage for probes used for opens...

2006-09-19

2006-09-19

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S115000, C324S072500

Reexamination Certificate

active

07109728

ABSTRACT:
Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.

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