Probe assembly with controlled impedance spring pin or...

Details Probe assembly with controlled impedance spring pin or... Probe assembly with controlled impedance spring pin or...

2006-10-03

2006-10-03

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020

Reexamination Certificate

active

07116121

ABSTRACT:
Uncontrolled characteristic impedance along a spring biased pin probe assembly is avoided by providing a stepped shelf of ground plane that extends outward along the pin and toward the target signal. The length of outward extension is chosen such that even when there is only (or at least) an expected minimum amount of compression of the spring while producing and maintaining contact, the entire exposed portion of the pin is over the shelf, whose depth of step has been selected to produce a selected Z0for the exposed pin that matches Z0for existing transmission lines already within the probe assembly. The spring biased pin may be a resistor tip spring pin that includes a small resistor in its tip.

REFERENCES:
patent: 4734046 (1988-03-01), McAllister et al.
patent: 5416429 (1995-05-01), McQuade et al.
patent: 5589781 (1996-12-01), Higgins et al.
patent: 6242930 (2001-06-01), Matsunaga et al.
patent: 6426637 (2002-07-01), Dang et al.

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