Probe assembly, method of producing it and electrical...

Details Probe assembly, method of producing it and electrical... Probe assembly, method of producing it and electrical...

2005-05-23

2010-02-23

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020, C324S758010, C439S074000

Reexamination Certificate

active

07667472

ABSTRACT:
A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.

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patent: WO 03/062837 (2003-07-01), None
patent: WO 2006/126279 (2006-11-01), None

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