Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-12-12
2006-12-12
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S430000
Reexamination Certificate
active
07148708
ABSTRACT:
A probe assembly for use with a battery impedance meter which minimizes excitation pick-up voltages by routing the wires from the meter to the battery cell terminals without forming a loop within a changing magnetic field caused by current drawn from the battery cell.
REFERENCES:
patent: 3873911 (1975-03-01), Champlin
patent: 6172505 (2001-01-01), Bertness
patent: 2004/0095249 (2004-05-01), Zaccaria
patent: 2005/0057256 (2005-03-01), Bertness
patent: 2006/0017447 (2006-01-01), Bertness et al.
BTech, Inc.
Davis David L.
Hirshfeld Andrew H.
Nguyen Hoai-An D.
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