Probe assembly for circuit-board tester

Details Probe assembly for circuit-board tester Probe assembly for circuit-board tester

1985-06-11

1987-08-11

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

439482, G01R 1067, G01R 1073

Patent

active

046864652

ABSTRACT:
A probe assembly for testing at least partially conductive elements has a dielectric base plate, a plurality of conductive supports on the base plate generally insulated from each other thereby, and each having a forwardly open socket having a forwardly concave socket surface, and a plurality of conductive contact rods, each having a substantially part-spherical rear ball end having an outer surface, and resting in a respective one of the sockets, and a forwardly directed front test end. According to the invention one of the surfaces is formed with at least one edge engaging only in line contact with the other surface. Thus, when the tips are engaged with conductive regions of an element to be tested, electrical connection can be made at the region of line contact between the contact rod and support.

REFERENCES:
patent: 4535536 (1985-08-01), Wyss
IBM Technical Disclosure Bulletin, Arnhart, J. et al., "Module Connector", vol. 19, No. 1, Jun. 1976, pp. 125-126.

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