Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1997-06-03
1999-05-11
Regan, Maura
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324520, G01R32/06
Patent
active
059031433
ABSTRACT:
This invention is an inexpensive probe apparatus operating at high precision that can be used for both low-frequency and high-frequency measurements. A line with a first and second conductor is extended from a probe connected to a circuit component. A low-frequency or high-frequency device is alternately connected to the line. A third common conductor runs parallel to the aforementioned line and a resistor and capacitor is connected between the probe end of the aforementioned second conductor and the aforementioned common conductor.
REFERENCES:
patent: 3702439 (1972-11-01), McGahey
patent: 4697143 (1987-09-01), Lockwood
patent: 4894612 (1990-01-01), Drake
patent: 5107201 (1992-04-01), Ogle
patent: 5172051 (1992-12-01), Zamborelli
patent: 5589781 (1996-12-01), Higgins
patent: 5625299 (1997-04-01), Uhling
patent: 5646542 (1997-07-01), Zamborelli
patent: 5680039 (1997-10-01), Mochizuki
Habu Satoshi
Mochizuki Kohei
Hewlett--Packard Company
Regan Maura
LandOfFree
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